Elettra Personal Web Page
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Dr. Werner Jark Phone ++39 040 375 8540
werner.jark@elettra.eu
Responsible for the development of advanced optics. Principal scientific interest: manipulating soft X-ray and hard X-ray beams by use of reflection, refraction and diffraction
primarily for the purpose of focusing and of energy dispersion (e.g. by use of multilayer coatings,
X-ray waveguides, alligator lenses, Clessidra prism array lenses, diffraction gratings).
 Reference publications: [1] X-ray focusing in one dimension in Clessidra prism arrays W. Jark, F. Pérennès, M. Matteucci, L. Mancini, F. Montanari, L. Rigon, G. Tromba, A. Somogyi, R. Tucoulou, S. Bohic
Focusing X-rays with simple arrays of prism-like structures
J. Synchrotron Rad. 11, 248-253 (2004), doi: 10.1107/S0909049504005825
[2] refraction of a plane X-ray wave at a flat interface W. Jark, L. Rigon, K. Oliver
Simultaneous determination of the x-ray refractive index and the attenuation length from a single radiograph of rectangular prisms
Opt. Commun. 284 (19), 4525-4528 (2011), doi: 10.1016/j.optcom.2011.06.035
[3] one-dimensional focusing of X-rays by refraction at a concave interface W. Jark, L. Rigon, K. Oliver
Revisiting the "forgotten" first zoomable refractive x-ray lens
SPIE - Proceedings: Advances in X-ray/EUV Optics and Components VI. Vol. 8139, 81390G (2011), doi: 10.1117/12.896425
[4] two-dimensional focusing of X-rays by refraction in a curved edge W. Jark, G. Grenci
Bi-dimensional focusing of X-rays by refraction in an edge
Opt. Lett. 39, 1250-1253 (2014), doi: 10.1364/OL.39.001250
[5] shadow behind an X-ray refracting short interface W. Jark
Proposal for a source size and source position monitor for high power x-ray sources based on a “negative” pinhole camera
SPIE - Proceedings: X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II, Vol. 9210, 92070L (2014), doi: 10.1117/12.2062567
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last update January 17, 2018, at 05:20 PM by Werner Jark login
