Welcome to ESCAmicroscopy @ ElettraThe Scanning photoelectron microscope (SPEM) hosted at the ESCAmicroscopy beamline allows to combine chemically surface sensitive measurements with high spatial resolution. A beam spot down to 120 nm and energy sensitivity within 180 meV using a third generation X-ray source providing more than 109 photons/s in the probe has opened the opportunity for material science to perform micro-characterization on a spatial scale comparable to that of the processes and the phases occurring on morphologically and chemically complex surfaces. The experimental apparatus allows to carry out a manifold of experiments, aiming at quantitative and qualitative chemical characterisation of morphologically complex materials including chemical reactions and mass transport processes leading to lateral changes in the composition, morphology and electronic properties of materials. (Research) (Beamline description) |
Research highlights
Imaging and Spectroscopy of Multiwalled Carbon Nanotubes during Oxidation: Defects and Oxygen Bonding
The gasification process, which increases the number of broken C = C bonds and the abundance of particular oxygenated functional groups, is shown to destroy carbon nanotubes (CNTs). The expansion of the defect density and dimensions leads to nonlinear consumption of the CNTs with increasing O dose.
Graphene oxide windows for in situ environmental cell photoelectron spectroscopy
We develop a simple environmental cell with graphene oxide windows that are transparent to low-energy electrons (down to 400 eV), and demonstrate the feasibility of X-ray photoelectron spectroscopy on samples such aqueous salt solution.
In Situ X-Ray Investigation of the SOFC Stability in Operating Condition
in situ study of electrochemically induced processes occurring in Cr/Ni bilayers in contact with a YSZ electrolyte aims at a molecular-level understanding of the aspects related to the durability of metallic interconnects in solid oxide fuel cells (SOFCs).
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Proposal SubmissionWe invite users and collabrators to discuss their proposals with the beamline local contacts well in advance before the submission deadline. This is crucial for a careful assesment of the experiment feasibility and may lead to improvements in the proposed experimental plan. In a restricted number of cases, when doubts arise about the suitability of your samples or the planned measurements are too close to the microscope resolution limit, it may be possible for you to arrange a test. Our website provides a wealth of informaiton on experiment feasibilty and proposal submission. For more info, please vist the user info section. |
Call for proposalsThe deadline for proposal submission for beamtime allocation from January 1st to June 30th, 2013 will be September 17th, 2012 at 4:30 pm (MET). |
New Undulator
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New Piezoelectric Stage
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