Satellite Workshop

"Resonant X-ray Scattering and Electronic Structure"

December 3, 2003

Supported by the International Atomic Energy Agency

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The high brightness and excellent polarization characteristics of modern synchrotron light sources have led to rapid progress in the investigation of electronic structure by resonant x-ray scattering. The Workshop will review the achievements to date in this field and examine new scientific opportunities for determining electronic structure from resonantly scattered x-rays. Speakers will cover both soft and hard x-ray studies, elastic and inelastic scattering and will approach the systems under study from both a theoretical and experimental perspective.

Invited speakers

• C.C. Kao, Brookhaven National Laboratory, Upton, NY, USA
• P. Carra, E.S.R.F., Grenoble, France
• Yves Joly - C.N.R.S. - Grenoble, France
• Akio Kotani, Institute for Solid State Physics, University of Tokyo, Japan
• Gerrit van der Laan, Daresbury Laboratory, Warrington, United Kingdom
• D.L. Ederer, Tulane University, New Orleans, Louisiana, USA
• S.B. Wilkins, E.S.R.F., Grenoble, France
• M. Neumann, University of Osnabrueck, Osnabrueck, Germany
• L.-C. Duda, Uppsala University, Uppsala, Sweden