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Sunday, 10 December 2000
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18:00 - 20:00 |
Welcome reception at the ICTP |
Monday, 11 December 2000
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8:45 - 9:00 |
Opening remarks by the workshop chairman G. Salviati |
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Session Synchrotron radiation techniques I, chair: Y. Watanabe |
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9:00 - 9:45 |
T. Kinoshita, University of Tokyo: WHAT CAN WE DO BY PHOTOELECTRON SPECTROMOCROSCOPY? |
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9:45 - 10:10 |
S. Di Fonzo, Sincrotrone Trieste: NON-DESTRUCTIVE DETERMINATION OF LOCAL STRAIN UNDER BURIED INTERFACES WITH 100-NANOMETER SPATIAL RESOLUTION |
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10:10 - 10:35 |
K. C. Prince, Sincrotrone Trieste: Surface chemistry of lead sulphide |
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10:35 - 11:30 |
coffee break |
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Session Synchrotron radiation techniques II, chair: N. Ueno |
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11:30 - 11:55 |
M. Kiskinova, Sincrotrone Trieste: Scanning Photoemission Microscopy: recent developments and applications |
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11:55 - 12:20 |
R. J. Phaneuf, University of Maryland: Spatially Resolved Spectra and Energetically Resolved Photoelectron Images of Reactive Surface Phases and PN-Junctions |
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12:20 - 12:45 |
R. Larciprete, Sincrotrone Trieste: VISIBLE AND UV PULSED LASER PROCESSING OF THE Ti/Si(001) INTERFACE STUDIED BY XPS MICROSCOPY WITH SYNCHROTRON RADIATION |
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12:45 - 13:10 |
E. Di Fabrizio, INFM-TASC: Zone Plate for x-ray applications |
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13:10 - 14:30 |
lunch break |
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Session Synchrotron radiation techniques III, chair: M. Kiskinova |
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14:30 - 15:15 |
N. Ueno, Chiba University: Imaging of organic thin films using electron emission microscope |
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15:15 - 15:40 |
M. Cinchetti, Johannes Gutenberg Universität Mainz: The Effect of Surface Defects on the Efficiency of GaAsP Photoemitters for Polarised Electron Sources |
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15:40 - 16:05 |
M. Mynar, Delong Instruments: X-ray photoemission and low energy electron microscope |
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16:05 - 16:30 |
B. Kaulich, ESRF: X-RAY MICROSCOPY AND SPECTROMICROSCOPY TECHNIQUES USING MULTI KEV PHOTONS |
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16:30 - 17:00 |
coffee break |
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Session Synchrotron radiation techniques IV, chair:T. Kinoshita |
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17:00 - 17:45 |
S. Heun, Sincrotrone Trieste: PHOTOELECTRON SPECTROSCOPY FROM INDIVIDUAL HETEROEPITAXIAL NANOCRYSTALS ON GaAs(001) |
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17:45 - 18:10 |
M. Bertolo, Sincrotrone Trieste: Cross-sectional photoemission microscopy of semiconductor heterostructures |
Tuesday, 12 December 2000
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Session Synchrotron radiation techniques V, chair: S. Heun |
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9:00 - 9:45 |
Y. Watanabe, NTT Basic Research Laboratories: Synchrotron radiation photoelectron spectroscopy of nanostructures |
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9:45 - 10:10 |
A. Barinov, Sincrotrone Trieste: Formation stages and thermal stability of metal/n-GaN interface |
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10:10 - 10:35 |
C. Teichert, Montanuniversität Leoben: Self-organized semiconductor nanostructures and their applications |
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10:35 - 11:30 |
coffee break |
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Session Scanning probe techniques I, chair: S. Ushioda |
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11:30 - 12:15 |
R. Cingolani, Universita' di Lecce: Wavefunction mapping in single quantum dots |
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12:15 - 12:40 |
J. Wiebe, Hamburg University: An Ultra High Vacuum-300 mK-Scanning Tunneling Microscope for Local Measurements of the Density of States on InAs(110) |
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12:40 - 13:05 |
F. Rosei, Università di Roma Tor Vergata: Growth and characterization of Ge/Si(111) quantum dots by Scanning Tunneling Microscopy |
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13:05 - 15:00 |
lunch break |
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15:00 - 18:00 |
Excursion to Sincrotrone Trieste |
Wednesday, 13 December 2000
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Session Scanning probe techniques II, chair: M. Sakurai |
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9:00 - 9:45 |
S. Ushioda, Tohoku University: Probing of electronic transitions with atomic scale spatial resolution |
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9:45 - 10:10 |
T. K. Johal, Universita di Lecce: IMAGING OF QUANTUM DOT STATES BY SCANNING TUNNELING SPECTROSCOPY |
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10:10 - 10:35 |
K. Kanisawa, NTT Basic Research Laboratories: IMAGING OF ZERO-DIMENSIONAL STATES IN SEMICONDUCTOR NANOSTRUCTURES USING SCANNING TUNNELING MICROSCOPY |
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10:35 - 11:00 |
B. Ressel, Sincrotrone Trieste: ELECTRONIC STRUCTURE OF THE Pb/Si(111) MOSAIC PHASE |
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11:00-11:30 |
coffee break |
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Session Scanning probe techniques III, chair: M. Colocci |
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11:30 - 12:15 |
M. Sakurai, RIKEN: STM-INDUCED LIGHT EMISSION FROM NANOSTRUCTURES ON A SI(001)-(2X1)-D SURFACE |
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12:15 - 12:40 |
L. Ottaviano, INFM Unità dell'Aquila: On the spatially resolved electronic structure of polycristalline WO3 films investigated with Scanning Tunneling Spectroscopy |
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12:40 - 13:05 |
J. P. Singh, Nuclear science Centre New Delhi: Electronic excitations induced enhancement in metallicity on HOPG and Si surfaces: in-situ STM/STS studies |
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13:05 - 14:30 |
lunch break |
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Session Scanning probe techniques IV, chair: K. Yagi |
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14:30 - 15:15 |
S.-W. Hla, Freie Universität Berlin: Single Molecule Engineering with a Scanning Tunneling Microscope |
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15:15 - 15:40 |
H. Iwasaki, Osaka University: STM Nanolithography on SiO2/Si |
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15:40 - 16:05 |
N. Jug, Institute Josef Stefan Ljubljana: Surface structure of some transition-metal trichalchogenides |
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16:05 - 16:50 |
A. Armigliato, CNR-Istituto LAMEL Bologna: STRAIN ANALYSIS IN SUBMICRON ELECTRON DEVICES BY CONVERGENT BEAM ELECTRON DIFFRACTION |
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16:50 - 17:00 |
coffee break |
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Session Scanning probe techniques V, chair: S.-W. Hla |
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17:00 - 17:45 |
M. Colocci, INFM Firenze: New trends in the optical investigation of semiconductor heterostructures at the nanoscale |
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17:45 - 18:10 |
A. Crottini, Swiss Federal Institute of Technology Lausanne: A novel tip-surface distance control for low temperature scanning near-field photoluminescence spectroscopy |
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18:10 - 18:35 |
L. Sirigu, Swiss Federal Institute of Technology-EPFL Lausanne: OPTICAL PROPERTIES OF V-GROOVE QUANTUM WIRE LASERS AND LED |
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20:00 - 23:00 |
Social dinner |
Thursday, 14 December 2000
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Session Electron microscopy techniques I, chair: G. Salviati |
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9:00 - 9:45 |
N. Yamamoto, Tokyo Institute of Technology: TEM-Cathodoluminescence Study of Microstructures and Defects in Semiconductor Epilayers |
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9:45 - 10:10 |
M. Ivanda, Rudjer Boskovic Institute Zagreb: COMPARISON OF HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY AND LOW FREQUENCY RAMAN SCATTERING IN DETERMINATION OF PARTICLES SIZE DISTRIBUTION OF NANOSIZED TiO2 |
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10:10 - 10:35 |
A. Patnaik, Indian Institute of Technology Madras: STRUCTURE AND CHARGE TRANSPORT IN N+ BEAM INDUCED pi-BONDED NANOCRYSTALLINE CLUSTERS IN POLY PHENYLENE OXIDE |
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10:35 - 11:00 |
J. Swiatowska-Mrowiecka, University of Mining and Metallurgy: INFLUENCE OF THE CRYSTALLOGRAFIC ORIENTATION ON THE MECHANISM OF ZINC DISSOLUTION IN ORGANIC SOLVENTS |
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11:00 - 11:30 |
coffee break |
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Session Electron microscopy techniques II, chair: N. Yamamoto |
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11:30 - 12:15 |
K. Yagi, Tokyo Institute of Technology: Surface Imaging with use of an Energy Filter |
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12:15 - 12:40 |
V.Grillo, Universitaet Erlangen-Nuernberg: COMPOSITIONAL FLUCTUATIONS AND LUMINESCENCE PROPERTIES OF InGaN QUANTUM WELLS GROWN ON GaN AND SAPPHIRE SUBSTRATES: A COMPARISON |
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12:40 - 13:05 |
M. Starowicz, University of Mining and Metallurgy, Krakow: ELECTROCHEMICAL DEPOSITION OF SI(IV) COMPOUNDS ON THE METAL SURFACE FROM ANHYDROUS ORGANIC SOLVENTS |
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13:05 - 14:30 |
lunch break |
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Session Electron microscopy techniques III, chair: T. Sekiguchi |
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14:30 - 15:15 |
G. Salviati, MASPEC-CNR Institute Parma: Cathodoluminescence submicrometric depth profiling of optical emissions in semiconducting heterostructures and devices |
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15:15 - 15:40 |
O. Martinez, Dpto. Física de la Materia Condensada. E.T.S.I.I. Valladolid: MICROCHARACTERIZATION OF CONFORMAL GaAs AND AlGaAs ON Si LAYERS BY SPATIALLY RESOLVED OPTICAL TECHNIQUES |
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15:40 - 16:25 |
T. Sekiguchi, National Research Institute for Metals Tsukuba: Low-energy Cathodoluminescence Study of Semiconductor Nanostructures and Nanoparticles |
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16:25 - 16:40 |
Concluding remarks by the workshop vice-chairman N. Yamamoto |
Friday, 15 December 2000
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8:00 - 22:00 |
Excursion to CNR-MASPEC in Parma |
Back to workshop home.
Last update: 11.01.2001 by S. Heun.