1st International Workshop on
Nano-scale Spectroscopy
and its Applications to
Semiconductor Research

Topics

  • Spectromicroscopy with synchrotron radiation (PEEM, Fresnel zone plates, Schwarzschild optics, SXTM).
  • Electron microscopy (CL-TEM, CL-SEM, SAM, TEM-EELS, SEM-FA, CBED).
  • Scanning probe techniques (STS, SNOM, CL-STM, OBIC).
  • Nanostructures (quantum dots, quantum wires, nanotubes)
  • Nanofabrication technology (nanolithography).

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    Last update: 28.09.2000 by S. Heun.