| exit |
beamline |
ext. # |
| 1.1 | TwinMic | 8479 |
| 1.2 | NANOSPECTROSCOPY | 8302/8 |
| 1.2 | FEL | 8316-8279 |
| 2.2 | ESCAMICROSCOPY | 8335/7 |
| 2.2 | SUPERESCA | 8342 |
| 3.2 | SPECTRO-MICROSCOPY | 8341-8336 |
| 3.2 | VUV PHOTOEMISSION | 8332-8060 |
| 4.2 | CIRCULARLY POLARIZED LIGHT | 8566-8074 |
| 5.2 | X-RAY SMALL-ANGLE SCATTERING (SAXS) | 8363 |
| 5.2 | X-RAY DIFFRACTION (XRD 1) | 8355-8349 |
| 6.1 | MATERIALS SCIENCE | 8095 |
| 6.1 | MAMMOGRAPHY (SYRMEP) | 8295 |
| 6.2 | GAS-PHASE PHOTOEMISSION | 8287 |
| 7.2 | SURFACE DIFFRACTION (ALOISA) | 8286-8369 |
| 8.1 | SOFT X-RAY OPTICAL SPECTROSCOPY (BEAR) | 8216 |
| 8.1 | PROXIMITY PHOTOLITHOGRAPHY (LILIT) | 8208/7 |
| 8.2 | BEAMLINE FOR ADVANCED DICHROISM (BACH) | 8698 |
| 9.1 | SOURCE FOR IMAGING AND SPECTROSCOPIC STUDIES IN THE INFRARED (SISSI) | 8567 |
| 9.2 | DICHROIC PHOTOEMISSION (APE) | 8075 |
| 10.1 | DEEP LITHOGRAPHY | 8076 |
| 10.2 | Inelastic Ultra Violet Scattering (IUVS) | 8516 |
| 10.2 | BAD Elph | 8652 |
| 11.1 | XAFS | 8431-8432/3 |
| 11.2 | X-RAY DIFFRACTION (XRD 2) | 8434/5 |