last update October 01, 2008, at 04:29 PM
by Andrea Locatelli
LEEM-PEEM is a biennial meeting reviewing the status of LEEM, PEEM, SPLEEM, XPEEM and related techniques. It aims at promoting and disseminating applications of cathode lens microscopy to a broad audience of interested scientists. The workshop highlights the most recent scientific advances as well as instrumental developments. Topics will cover thin films, organic films, surface chemistry, magnetism, time resolved methods, instrumental advances, and novel applications of LEEM and XPEEM to other subject areas.
International advisory board
Michael Altman, Hong Kong University of Science and Technology
Ernst Bauer, Arizona State University
Gary Kellogg, Sandia National Laboratories
Takanori Koshikawa Osaka, Electro-Communication Univ.
Andrea Locatelli, Elettra
Bene Poelsema, University of Twente
Rudolph Tromp, IBM T.J. Watson Research Center
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