BACH Publications

2016

  1. Contamination-free suspended graphene structures by a Ti-based transfer method
    Matruglio A, Nappini S, Naumenko D, Magnano E, Bondino F, Lazzarino M, Dal Zilio S
    Carbon, Vol. 103, pp. 305-310 (2016)
    doi: 10.1016/j.carbon.2016.03.023
  2. Effective Work Function Reduction of Practical Electrodes Using an Organometallic Dimer
    Akaike K, Nardi MV, Oehzelt M, Frisch J, Opitz A, Christodoulou C, Ligorio G, Beyer P, Timpel M, Pis I, Bondino F, Moudgil K, Barlow S, Marder SR, Koch N
    Advanced Functional Materials (2016)
    doi: 10.1002/adfm.201504680
  3. Indentation fracture toughness of single-crystal Bi2Te3 topological insulators
    Lamuta C, Cupolillo A, Politano A, Aliev ZS, Babanly MB, Chulkov EV, Pagnotta L
    Nano Research, pp. 1-11 (2016)
    doi: 10.1007/s12274-016-0995-z
  4. Local Structure of V Dopants in TiO2 Nanoparticles: X-ray Absorption Spectroscopy, Including Ab-Initio and Full Potential Simulations
    Rossi G, Calizzi M, Di Cintio V, Magkos S, Amidani L, Pasquini L, Boscherini F
    Journal of Physical Chemistry C (2016)
    doi: 10.1021/acs.jpcc.5b12045
  5. Nanoindentation of single-crystal Bi2Te3 topological insulators grown with the Bridgman–Stockbarger method
    Lamuta C., Cupolillo A., Politano A., Aliev Z.S., Babanly M.B., Chulkov E.V., Alfano M., Pagnotta L.
    Physica Status Solidi (B): Basic Research (2016)
    doi: 10.1002/pssb.201552760
  6. Study of Electronic structure and Magnetic Properties of Epitaxial Co2FeAl Heusler Alloy Thin Films
    Soni S., Dalela S., Sharma S.S., Liu E.K., Wang W.H., Wu G.H., Kumar M., Garg K.B.
    Journal of Alloys and Compounds (2016)
    doi: 10.1016/j.jallcom.2016.03.052
  7. Surface-Confined Polymerization of Halogenated Polyacenes: The Case of Dibromotetracene on Ag(110)
    Píš I., Ferrighi L., Nguyen T.H., Nappini S., Vaghi L., Basagni A., Magnano E., Papagni A., Sedona F., Di Valentin C., Agnoli S., Bondino F.
    Journal of Physical Chemistry C (2016)
    doi: 10.1021/acs.jpcc.5b12047
  8. The electronic structure formation of CuxTiSe2 in a wide range (0.04 < x < 0.8) of copper concentration
    Shkvarin A.S., Yarmoshenko Y.M., Yablonskikh M.V., Merentsov A.I., Shkvarina E.G., Titov A.A., Zhukov Y.M., Titov A.N.
    Journal of Chemical Physics, Vol. 144\",issue_number\" - n/a (2016)
    doi: 10.1063/1.4941767
Last Updated on Tuesday, 22 March 2016 09:27