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Soft x reflectivity of organic films

Polarized resonant soft x ray reflectivity was taken at the carbon K-edge of a self assembled organic film of 1,4-benzenedimethanethiol (BDMT) molecules deposited on gold. The measured reflectivity was simulated by a parameterized phenomenological model, which was fitted to the experimental lineshape. The organic film was treated as an anisotropic material, described by a dielectric tensor with elements obtained from the anisotropic absorption cross section of the molecules, calculated through density functional theory (DFT). L. Pasquali et al., Physical Review B. 89, 045401 (2014)
  

A quantitative approach was developed for the determination of molecular arrangement and electronic structure in anisotropic organic ultra-thin films based on polarized reflectivity at the carbon K-edge. Spectra were fitted to a parameterized model calculation. To simulate reflectivity, the anisotropic film was described by a dielectric tensor, obtained by ab-initio calculations for the single molecule and suitable rotations to describe the molecular organization in film domains.

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Structural and electronic properties of anisotropic ultrathin organic films from dichroic resonant soft x-ray reflectivity, 
 Luca Pasquali, Subhrangsu Mukherjee, Fabio Terzi, Angelo Giglia, Nicola Mahne, Konstantin Koshmak, Vladimir Esaulov, Chiara Toccafondi, Maurizio Canepa and Stefano Nannarone, Physical Review B 89, 045401 (2014)
 

 

Last Updated on Wednesday, 01 October 2014 09:35