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For the Materials Science Beamline we accept two types of proposals:
  1. Single technique: for the users that do not want to combine several different laboratories.
  2. Multi-technique: for the users that want to combine the measurements at the Materials Science Beamline with experiments in at least one other laboratory (complete list is here).
The link in VUO is "Submit a new CERIC proposal".

The usual deadlines for the submission are:
  • beginning of March and beginning of September: for the users that want to have their proposal technically pre-evaluated and checked, with the possibility to correct and/or improve it;
  • end of March and end of September: definitive deadline for submission.
After the submission, the proposal will be technically evaluated by the Materials Science Beamline staff and scientifically evaluated by the international reviewing committee.

Apart from the specific suggestions from the Proposal Review Panel, we list the typical problems of the proposals at the Materials Science Beamline pointed out by the reviewers:
  • The use of synchrotron radiation is not necessary. Some results can be obtained also using high-resolution photoemission with laboratory X-ray source (monochromatized or not) so you have to explain your motivation for applying for experimental time at synchrotron. The reasons can be e.g. the tunability necessary for resonant photoemission or NEXAFS, cross sections, surface sensitivity...
  • Technical requests were not compatible with the available experimental equipment (e.g. photon energy, sample annealing/cooling temperatures, UHV compatibility and electrical conductivity of the samples): please, check the instrument parameters and/or discuss the possibilities with the beamline staff.
  • The requested number of shifts was too high/too low. Bear in mind that for the correct evaluation you have to state clearly in the proposal the total number of samples and the experimental procedure for every sample (e.g. sample prepared ex situ/in situ, cleaning procedure, annealing, exposures, evaporation).
For the above stated reasons, we invite you not to forget to carefully fill safety forms for every compound used and also the following sections during the submission procedure:
  • Sample Treatment: describe what do you need to do with your samples apart from their measurements, e.g. ion sputtering, annealing/cooling, overlayer deposition by evaporation, gas exposure...
  • Available Equipment: list all the experimental equipment you intend to use of those permanently available at the laboratory (e.g. manipulators, evaporators, gases, power supplies);
  • Additional Equipment: list all the additional equipment you need to bring from your home institute (e.g. evaporators, gas exposure systems);
  • Offline Facilities: e.g. chemical lab, spot welder, dessicator.
If you have questions do not hesitate to contact the beamline staff well before the submission deadline. Please be aware that suitable samples in general are UHV compatible and electrically conductive flat plates. Other forms of materials (e.g. thin films or powders) must be discussed in any case.

Last Updated on Sunday, 10 May 2020 14:29