Elettra-Sincrotrone Trieste S.C.p.A. website uses session cookies which are required for users to navigate appropriately and safely. Session cookies created by the Elettra-Sincrotrone Trieste S.C.p.A. website navigation do not affect users' privacy during their browsing experience on our website, as they do not entail processing their personal identification data. Session cookies are not permanently stored and indeed are cancelled when the connection to the Elettra-Sincrotrone Trieste S.C.p.A. website is terminated.
More info

NanoESCA publications


  1. Beyond van der Waals Interaction: The Case of MoSe2 Epitaxially Grown on Few-Layer Graphene
    Dau Minh Tuan, Gay Maxime, Di Felice Daniela, Vergnaud Céline, Marty Alain, Beigné Cyrille, Renaud Gilles, Renault Olivier, Mallet Pierre, Le Quang Toai, Veuillen Jean-Yves, Huder Loïc, Renard Vincent T., Chapelier Claude, Zamborlini Giovanni, Jugovac Matteo, Feyer Vitaliy, Dappe Yannick J., Pochet Pascal, Jamet Matthieu
    ACS Nano, Vol. 12 - 3, pp. 2319-2331 (2018)
    doi: 10.1021/acsnano.7b07446
  2. Degeneracy Lifting of Adsorbate Orbitals Imaged by High-Resolution Momentum Microscopy
    Graus Martin, Metzger Christian, Grimm Manuel, Feyer Vitaliy, Puschnig Peter, Schöll Achim, Reinert Friedrich
    J. Phys. Soc. Jpn., Vol. 87 - 6, pp. 061009 (2018)
    doi: 10.7566/JPSJ.87.061009
  3. High-temperature 2D Fermi surface of SrTiO3 studied by energy-filtered PEEM
    Mathieu Claire, Gonzalez Sara, Lubin Christophe, Copie Olivier, Feyer Vitaliy, Schneider Claus M., Barrett Nick
    Surface and Interface Analysis (2018)
    doi: 10.1002/sia.6533
  4. Nonlocal electron correlations in an itinerant ferromagnet
    Tusche Christian, Ellguth Martin, Feyer Vitaliy, Krasyuk Alexander, Wiemann Carsten, Henk Jürgen, Schneider Claus M., Kirschner Jürgen
    Nature Communications, Vol. 9 - 1, pp. 3727 (2018)
    doi: 10.1038/s41467-018-05960-5
  5. Photoelectron microscopy at Elettra: Recent advances and perspectives
    Amati M., Barinov A., Feyer V., Gregoratti L., Al-Hada M., Locatelli A., Mentes T.O., Sezen H., Schneider C.M., Kiskinova M.
    Journal of Electron Spectroscopy and Related Phenomena, Vol. 224, pp. 59-67 (2018)
    doi: 10.1016/j.elspec.2017.06.006
  6. Principal component analysis: Reveal camouflaged information in x-ray absorption spectroscopy photoemission electron microscopy of complex thin oxide films
    Giesen Margret, Jugovac Matteo, Zamborlini Giovanni, Feyer Vitaliy, Gunkel Felix, Mueller David N.
    Thin Solid Films, Vol. 665, pp. 75-84 (2018)
    doi: 10.1016/j.tsf.2018.09.010
Last Updated on Thursday, 31 May 2012 13:24