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Microfocussing VLS grating-based beamline for advanced microscopy;
D. Cocco, M. Marsi, M. Kiskinova, K. C. Prince, T. Schmidt, S. Heun, and E. Bauer;
Proc. SPIE 3767 (1999) 271 - 279.
view article
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High lateral resolution spectroscopic imaging of surfaces: The undulator beamline "Nanospectroscopy" at Elettra;
A. Locatelli, A. Bianco, D. Cocco, S. Cherifi, S. Heun, M. Marsi, M. Pasqualetto, and E. Bauer;
J. Phys. IV 104 (2003) 99 - 102.
view article
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Kirkpatrick-Baez elliptical bendable
mirrors at the Nanospectroscopy beamline: metrological results and x-rays performance;
A. Bianco, G. Sostero, and D. Cocco;
Proc. SPIE 4782 (2002) 74;
view article
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New optical setup for the generation of variable spot size on third generation synchrotron beamlines;
T. Moreno, R. Belkhou, G. Cauchon and M. Idir;
Proc. SPIE, Advances in Metrology for X-ray and EUV Optics, Vol 5921 (2005) 0F1-0F7;
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