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last update 15/02/2010
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 Second branch microscope: introduction 

Specifications | Description | Operation modes | XPEEM and LEEM methods

The endstation on the second branch of the Nanospectroscopy beamline operates a new version of the LEEM-PEEM microscope (LEEM V, Elmitec GmbH) originally designed by Prof. E. Bauer (now at Arizona State University). This project has been initiated and funded by the CNRS within the framework of LURE "Option I" and with the collaboration of the Laboratories L. Nèel and Cristallographie of Grenoble - France. The instrument has been operational and open to external users at ELETTRA starting from February 2006, prior to it final destination at SOLEIL in 2010.

The instrument has been designed in order to optimize the photon flux on the sample. The upright geometrical configuration enables to obtain an almost isotropic beamspot: 7−10 µm (Hor.) and 10−15 µm (Vert.), which allows working with most suitable microscope field of views. The electron optics column allows higher performance X-PEEM measurements. In particular, a new design of the electron beam separator has been developed (90° sector field). This allows the further upgrade of the instrument with the introduction of an electron mirror to correct the spherical and chromatic aberrations. Indeed, a key limitation to the performance of the electron-optical X-ray microscopes is the chromatic and spherical aberrations of the immersion lens. This problem constrains the X-PEEM microscope to a fairly small transmission in an attempt to offset the problem. The combination of an aberration correction mirror with a properly designed objective lens can highly reduce the aberrations. Therefore both transmission and spatial resolution will be enhanced. Two major projects using correcting mirrors are presently under construction and development: PEEM3 at ALS and SMART project at BESSYII. The construction of such correcting mirror and it installation on our Elmitec's instrument is under consideration and will be performed at SOLEIL.

The French X-PEEM microscope will be further upgraded by the installation of an energy filter analyzer in 2010.