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Introduction |
Description |
Operation modes |
XPEEM and LEEM methods
Elmitec LEEM V microscope:
Cathode lens: magnetic triode
Beam separator: 90° symmetry
Contrast aperures: 20, 30 and 100µm.
illumination aperures: 2, 5 and 20µm
Angle of incidence photon beam - sample: 16° along the horizontal plane;
[beamline specifications can be found here]
Performance:
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operation mode
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lateral resolution
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energy resolution
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field of view
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XAS/XMCD/XMLD imaging:
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40 nm, routinely
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200 meV @ 600 eV
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3 to 15 µm
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LEEM imaging:
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15 nm
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3 to 50 µm
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UV-PEEM imaging:
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20 nm
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3 to 70 µm
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We inform users that the French X-PEEM on the second branch of the Nanospectroscopy beamline did not receive the energy filter as previously announced. Therefore only magnetic imaging proposals will be accepted on this branch.
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Sample stage specifications
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Samples must be conductive. All details about the sample size and the available sample cartidges can be found here.
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Sample heating:
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radiative
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Tmax=700°K
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e-beam (100 mA, 1200V)
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Tmax=1300°K [imaging]
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" "
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Tmax: more than 2000°K [flashes only]
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sample cooling:
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LN manipulator
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Tmin=150°K
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| The sample temperature is read by a type C thermocouple (W5%Re/W26%Re), which is mounted close to the sample, or with an optical pyrometer. The calibration parameters can be found here. A calibration table is also available. |
Available facilities
Hg lamp.
Gas line with precision leak valves.
e-beam evaporators (Omicron and Elmitec).
One retractable stage for mounting e-beam evaporators without breaking vacuum.
Sample parking stage with 3 slots for sample cartridges in Prep chamber.
Magnetisation stage.
Preparation chamber with Ar sputtering and sample heater (up to 3 cartridges).
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