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last update 15/02/2010
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 PUBLICATIONS (SPELEEM @ Gas Phase)

The protype of the SPELEEM, developed in Claustal University by Ernst Bauer and his research group, was hosted at the Gas Phase beamline during the late '90s. The works listed here illustrate the results obtained with the first SPELEEM, pioneering spectro-microscopy with the PEEM. This list was compiled by S. Heun.
To return to the publication list of the Nanospectroscopy beamlime please click here.
2003 | 2002 | 2001 | 2000 | 1999 | 1998 | 1997

 2003
  1. AFM anodization studied by spectromicroscopy;
    M. Lazzarino, S. Heun, B. Ressel, K. C. Prince, P. Pingue, and C. Ascoli;
    Nucl. Instr. and Meth. in Phys. Res. B 200, 46-51 (2003).
    view article
 2002
  1. Atomic force microscope anodic oxidation studied by spectroscopic microscopy;
    M. Lazzarino, S. Heun, B. Ressel, K. C. Prince, P. Pingue, and C. Ascoli;
    Appl. Phys. Lett. 81, 2842-2844 (2002).
    view article

  2. Photoelectron spectroscopy with a photoemission electron microscope;
    S. Heun and Y. Watanabe;
    Springer Lecture Notes in Physics 588, 157-171 (2002).
    view article
 2001
  1. Core-level photoelectron spectroscopy from individual heteroepitaxial nanocrystalson GaAs(001);
    S. Heun, Y. Watanabe, B. Ressel, D. Bottomley, Th. Schmidt, and K. C. Prince;
    Phys. Rev. B 63, 1253351-8 (2001).
    view article

  2. Valence band alignment and work function of heteroepitaxial nanocrystals on GaAs(001);
    S. Heun, Y. Watanabe, B. Ressel, Th. Schmidt, and K. C. Prince;
    J. Vac. Sci. Technol. B 19, 2057-2062 (2001).
    view article

  3. Spatial variation of Au coverage as the driving force for nanoscopic pattern formation;
    F.-J. Meyer zu Heringdorf, Th. Schmidt, S. Heun, R. Hild, P. Zahl, B. Ressel, E. Bauer, and M. Horn-von Hoegen;
    Phys. Rev. Lett. 86, 5088-5091(2001).
    view article

  4. Local Au coverage as driving force for Au induced faceting of vicinal Si(001): a LEEM and XPEEM study;
    F.-J. Meyer zu Heringdorf, R. Hild, P. Zahl, Th. Schmidt, B. Ressel, S. Heun, E. Bauer, and M. Horn-von Hoegen;
    Surf. Sci. 480, 103-108 (2001).
    view article

    Erratum: Surf. Sci. 496, 151 (2001).
    view article
 2000
  1. Surface Diffusion of Au on Si(111): A microscopic study;
    J. Slezak, M. Ondrejcek, Z. Chvoj, V. Chab, H. Conrad, S. Heun, Th. Schmidt, B. Ressel, and K. C. Prince;
    Phys. Rev. B 61 (2000) 16121-16128.
    view article

  2. XPEEM study of liquid Au-Si droplets on Si(111) near to the eutectic point;
    B. Ressel, S. Heun, Th. Schmidt, and K. C. Prince;
    Defect and Diffusion Forum 183-185 (2000) 181-188.
    view article

  3. Growth of thin metal films studied by spectromicroscopy;
    Th. Schmidt, B. Ressel, S. Heun, K. C. Prince, and E. Bauer;
    AIP Conf. Proc. 507 (2000) 27-32.
    view article

  4. Nano-scale spectroscopy and its applications to semiconductors;
    S. Heun and G. Salviati;
    Notiziario Neutroni e Luce di Sincrotrone 5, 1 (2000) 23-33,
    view article

  5. SPELEEM study of Au surface diffusion on Si(111);
    J. Slezak, M. Ondrejcek, Z. Chvoj, V. Chab, H. Conrad, S. Heun, Th. Schmidt, B. Ressel, and K. C. Prince;
    Elettra Newsletter 37 (2000).
    view article
 1999
  1. Lateral inhomogeneities in engineered Schottky barriers;
    S. Heun, T. Schmidt, J. Slezak, J. Diaz, K. C. Prince, B. H. Müller, and A. Franciosi;
    J. Crystal Growth 201/202, 795-799 (1999).
    view article

  2. Preliminary spectromicroscopic measurements of self-organized InAs nanocrystalsby SPELEEM;
    Y. Watanabe, S. Heun, Th. Schmidt, and K. C. Prince;
    Jpn. J. Appl. Phys. 38 Suppl. 38-1, 556-559 (1999).
    view article

  3. Optical layout of a beamline for photoemission microscopy;
    Th. Schmidt, J. Slezak, S. Heun, J. Diaz, R. R. Blyth, R. Delaunay, D. Cocco, K. C. Prince, E. Bauer, and M. Coreno;
    J. Synchrotron Rad. 6, 957-963 (1999).
    view article

  4. Nanospectroscopy at Elettra;
    S. Heun, Th. Schmidt, B. Ressel, E. Bauer, and K. C. Prince;
    Synchrotron Radiation News 12 (5), 25-29 (1999).
    view article

  5. Microfocussing VLS grating-based beamline for advanced microscopy;
    D. Cocco, M. Marsi, M. Kiskinova, K. C. Prince, T. Schmidt, S. Heun, and E. Bauer;
    Proc. SPIE 3767, 271-279 (1999).
    view article

  6. Lateral inhomogeneities in engineered Schottky barriers;
    S. Heun, Th. Schmidt, J. Slezak, J. Diaz, K. C. Prince, B. H. Müller, A. Franciosi, and E. Bauer;
    Elettra Newsletter 32, (1999).
    view article

  7. Au induced giant faceting of vicinal Si(001);
    F.-J. Meyer zu Heringdorf, R. Hild, P. Zahl, M. Horn-von Hoegen, Th. Schmidt, S. Heun, B. Ressel, and E. Bauer;
    Elettra Highlights 1998-1999, Sincrotrone Trieste 42-44, (1999).
    view article

  8. Giant faceting of vicinal Si(001) induced by Au adsorption;
    F.-J. Meyer zu Heringdorf, R. Hild, P. Zahl, Th. Schmidt, S. Heun, B. Ressel, E. Bauer, and M. Horn-von Hoegen;
    Elettra Newsletter 36 (1999).
    view article
 1998
  1. SPELEEM: combining LEEM and spectroscopic imaging;
    Th. Schmidt, S. Heun, J. Slezak, J. Diaz, K. C. Prince, G. Lilienkamp, and E. Bauer;
    Surf. Rev. Lett. 5, 1287-1296 (1998).
    view article

  2. Giant facetting of vincinal Si(001) induced by Au adsorption;
    F.-J. Meyer zu Heringsdorf, D. Kaehler, Th. Schmidt, E. Bauer, H. Minoda, K. Yagi, M. Horn-von Hoegen;
    Surf. Rev. Lett. 5, 1167-1178 (1998).
    view article

  3. The SPELEEM microscope;
    Th. Schmidt, J. Slezak, S. Heun, J. Diaz, K. C. Prince, and E. Bauer;
    Elettra Highlights 1997-1998, Sincrotrone Trieste, 54-57 (1998).
    view article

  4. Photoelectron diffraction pattern taken by the SPELEEM microscope;
    Th. Schmidt, S. Heun, K. C. Prince, and E. Bauer;
    Elettra Newsletter 24 (1998).
    view article

  5. Fresnel fringes in a nanoscale system;
    Th. Schmidt, J. Slezak, S. Heun, J. Diaz, K. C. Prince, and E. Bauer;
    Elettra Newsletter 28 (1998).
    view article
 1997
  1. Recent Advances in LEEM/PEEM for structural and chemical Analysis,
    E. Bauer;
    in: Chemical, Structural and Electronic Analysis of Heterogeneous Surfaceson Nanometer Scale, ed. by R. Rosei (Kluwer Acad. Publ., Dordrecht, 1997) 75-91.
    view article

  2. Spectromicroscopy in a Low Energy Electron Microscope;
    E. Bauer, C. Koziol, G. Lilienkamp, and T. Schmidt;
    J. Electron Spectrosc. Rel. Phenomena 84, 201-209 (1997).
    view article

  3. Cathode Lens Spectromicroscopy with a Low Energy Electron Microscope;
    G. Lilienkamp, C. Koziol, Th. Schmidt, and E. Bauer;
    in: X-ray Microscopy and Spectromicroscopy, ed. by J. Thieme, E. Schmahl, E. Umbach, and D. Rudolph (Springer Verlag, Heidelberg, 1997).

  4. Multi-Method Surface Microscopy with Slow Electrons,
    E. Bauer;
    in: Advanced Surface Analytical Techniques, ed. by R. Shimizu and Y. Nihei (Jap. Soc. Promotion Sci., 87-92, 1997).