Hard X-ray Optics Laboratory
Activity
Research activity
Instrumentation available
- W X-ray source dedicated to Lawe diffraction for crystals orientation using polaroid films.
- X-ray source mounted on a double q-2q goniometer system remote controlled for testing large area single crystals or multilayers.
Mechanical resolution 10-4 deg, the energy resolution depends on the monocromator crystal used, generally from 10-3 to 10-5 for si111, si333 or si511 respectively.
The test station is equipped with a single counter NaI detector for roking-curve and/or reflectivity measurements and a MCP intensified CCD for local topographic information.
- Piezotranslator system (PI) displacement 100mm with strain gauge
- Piezogoniometer system (PI) resolution 2·10-2 arcsec with strain gauge
- Huber goniometers of several dimensions with the possibility to be motorised and remote controlled
- Controllers for stepping motors and dc motors
- Gas powered Diamond Anvil Cell (DAC) and mechanical Mao Bell DAC for High Pressure (HP) diffraction investigation.
Contacts
Edoardo Busetto (Responsible)
email edoardo.busetto@elettra.trieste.it
tel: + 39 040 375 8033/8621