The Multilayer Technology Laboratory

The laboratory was established in 1992 and is fully operational since the beginning of 1994.

It is devoted to the development of special multilayer optical systems for synchrotron radiation research (from about 50 eV to several keV photon energy), which are not readily commercially available.

The personnel at the laboratory can optimise and define the thickness parameters of multilayer systems for optical applications by use of standard and special simulation software. It may eventually deposit multilayer systems, which can be composed of at most 3 different materials (right now are available: C, Si, Ge, Fe, Co, Sc, Cr, W, Mo, Gd). These objects can be characterised immediately by use of standard laboratory optical and X-ray methods. The further characterisation and application of the objects by use of soft X-ray radiation is possible.

Recently the multilayer laboratory has been charged with the construction of a bending magnet beamline for an X-ray fluorescence microprobe. This beamline will supply tuneable X-rays with medium energy resolution in a spot of <1 mm diameter.

Research areas

Laboratory instrumentation

For sample preparation: Triode sputter deposition system Plassys TSS450

the concept

the realization

For sample characterisation: X-ray white light diffractometer

the concept

example of test

For sample characterisation and utilisation with synchrotron radiation: Soft X-ray polarimeter

the polarimeter

its operational parameters

fit procedure

More details about



References

References page




Contacts

Werner Jark
email werner.jark@elettra.trieste.it
tel: + 39 040 375 8540 (office)
fax: + 39 040 375 8776