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Scope
of the workshop
X-ray
spectromicroscopy
and imaging are continuously developing techniques bridging the gap
between visible light microscopy and electron, and other charged
particle microscopy, particularly in terms of penetration, lateral
resolution, and chemical sensitivity and specifity (micro-XANES, XRF etc). State-of-the-art performance
in all these areas is undergoing steady improvement using
3rd and 4th generation
synchrotron light sources as well as X-ray laboratory sources. The workshop tackles the scopes in
- §One-dimensional and two-dimensional X-ray focusing
- Critical comparison of different imaging
methods
- Progress on data analysis and image processing methods
- Microtomography and
phase sensitive imaging
- Detectors with high DQE
- Spectromicroscopy and imaging with FEL as well as lab sources
- fs and ps time resolved X-ray spectromicroscopy and imaging
The
workshop
welcomes specialists from all over the world to establish the
International Consortium on X-ray Imaging
“I<CCDX>I”, and to form a Round Table
for the fabrication of diffractive X-ray optics in frame of the EC FP6 I3
initiative.
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