MCX
Welcome to the MCX beamline!!
The Materials Characterisation by X-ray diffraction (MCX) beamline allows to perform a wide range of non-single crystal diffraction experiments: grazing angle diffraction and reflectivity, residual stress and texture analysis, phase identification and structural studies and kinetic studies. Systems that can be investigated vary from organic and inorganic thin films, to thermally and/or mechanically modified surfaces of mechanic components, to polymers, catalysts and highly disordered materials in the form of films, powders, fibers. In addition to the scientific heritage, a valuable activity will be the support to technology and industrial production, both for specific tasks of non-destructive control and for the development of new products. |
Research Highlights![]() Interaction mediated growth of chitosan and fatty acid binary system at air-water and air-solid interfaces
![]() Non destructive XRD investigations on grisaille paint layerson stained glass windows
Non destructive and innovative XRD experiments on the MCX beamline allowed us to recognize the alteration products on the grisailles surface and to propose a mechanism for the formation of alteration patinae. ![]() Structure of Sm- and Gd-doped ceria
Looking for potential nuclear waste disposal materials: Thermo-elastic behaviour of CsAlSiO4 (ABW)
![]() Residual stress and texture gradients in protective nickel coatings
The beamline MCX offers a perfect design and geometrical set-up for residual stress and texture analysis by X-ray diffraction. This work presents an example of application of X-ray diffraction to the study of residual stress and texture gradients in electrodeposited Nickel coatings. ![]() Energy Storage : Groundbreaking electrode for potassium ion batteries
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User Area
Proposal SubmissionWe invite users and collaborators to discuss their proposals with the beamline local contacts well in advance before the submission deadline. This is crucial for a careful assessment of the experiment feasibility and may lead to improvements in the proposed experimental plan. For more info, please visit the user info section. |
Call for proposalsThe deadline for proposal submission for beamtime allocation from January 1st to June 30th, 2022 will be September 15th, 2021.
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Reference paper
The refererence paper to be cited in your papers following measurements at the MCX beamline is:The X-ray diffraction beamline MCX at Elettra: a case study of non-destructive analysis on stained glass
Plaisier Jasper Rikkert, Nodari Luca, Gigli Lara, Rebollo San Miguel Elena Paz, Bertoncello Renzo, Lausi Andrea
ACTA IMEKO, Vol. 6 - 3, pp. 71-75 (2017)
doi: 10.21014/acta_imeko.v6i3.464
or
MCX: A synchrotron radiation beamline for X-ray diffraction line profile analysis
Rebuffi L, Plaisier JR, Abdellatief M, Lausi A, Scardi P
Zeitschrift fur Anorganische und Allgemeine Chemie 640 3100–3106. (2014).
doi: 10.1002/zaac.201400163