The analysis of chemical and electronic states in complex and nanostructured material systems requires electron spectroscopy to be carried out with nanometer lateral resolution, i.e. spectronanoscopy. This goal is achieved in  NanoESCA instrument by combining a parallel imaging photoelectron emission microscope with an appropriate energy filter. This instrument has a particular emphasis on the spectroscopic aspects and enables laterally resolved photoelectron spectroscopy from the VUV up into the hard x-ray regime.

The design includes a non-magnetic, electrostatic PEEM lens and a double-pass hemispherical analyser. Rapid PEEM survey imaging (< 50 nm resolution) can be used to locate features, whilst its lateral resolution in imaging ESCA of 150 nm at the Synchrotron is simply unique.

Research | Applications | Highlights | Publications

Ferroelectric domains

The objective of this work was to quantify the critical doping level and then to investigate the polarization dependence of the band structure at the surface of the doped ferroelectric domains.
J. E. Rault et al., Phys. Rev. Lett. 111, 127602 (2013).

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Molecular orbitals mapping

We have demonstrated that combining low energy electron diffraction with angle-resolved photoelectron spectroscopy is a very powerful method to elucidate the geometric and electronic structures of ordered molecular adsorbates. We applied this approach to the two different monolayer phases of PTCDA on Ag(110).
M. Wießner et al., Phys. Rev. B 86, 045417 (2012).

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The concept of NanoESCA

• IDEA aberration-corrected band pass energy filter
• Compensation of first analyser errors by second analyser allows large slits (1-2mm) and small pass energy
• No intermixing of spatial and energy information
• Result: high transmission imaging energy analyser  

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A novel electrostatic PEEM microscope named NanoESCA (FOCUS GmbH/Omicron) with energy filter
has been installed and commissioned on the second
branch of Nanospectroscopy. NanoESCA beamline is
managed by an international consortium lead by
Prof.Dr. Claus Michael Schneider (Forschungszentrum Jülich). 

Jülich Synchrotron Radiation Laboratory (JSRL)


User Area

Proposal Submission

We invite users and collaborators to discuss their proposals with the beamline local contacts well in advance before the submission deadline. This is crucial for a careful assessment of the experiment feasibility and may lead to improvements in the proposed experimental plan. In a restricted number of cases, when doubts arise about the suitability of your samples or the planned measurements are too close to the microscope resolution limit, it may be possible for you to arrange a test.

Call for proposals

The deadline for proposal submission for beamtime allocation from January 1st to June 30th, 2017 will be September 15th, 2016.

Beamline is open

From January 2012 NanoESCA beamline is opened to Elettra general users (35% of the total beamtime availablen Nanospectroscopy). All proposals requiring this instrument must be submitted on the Virtual Unified Office indicating NanoESCA as beamline. 

Recent developments 

Spin-resolved photoelectron spectroscopy@NanoESCA beamline

The PEEM at the beamline is now equipped with the 2-dimensional spin polarimeter  (Ch. Tusche, et al., App. Phys Lett 99, 032505 (2011)). This set-up allows acquiring spin-resolved images in both real and  reciprocal space. The working principle of the spin polarimeter is the asymmetry induced by the spin–orbit interaction occurring at reflection on a W(100) crystal. The chosen geometry makes the polarimeter sensitive to in-plane magnetization of the sample.
The set-up is currently under commissioning. Experiments elucidating the spin-resolved three-dimensional Fermi surface of ferromagnetic fcc cobalt are underway. 


Other branchline

The Nanospectroscopy beamline at Elettra operates the Spectroscopic and low energy electron microscope (SPELEEM), a state-of-the-art photoemission electron microscopy (XPEEM). Research applications are targeted to Surface and Materials Sciences, addressing issues related to chemical and magnetic characterization of surfaces, interfaces, thin films, and nanostructures.
Last Updated on Tuesday, 11 July 2017 12:31