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Scanning photoelectron microscope (SPEM)
With respect to the other photoelectron microscopy techniques a Scanning photoelectron microscope (SPEM) uses the most direct approach to photoelectron spectromicroscopy which is the use of a small focused photon probe to illuminate the surface (see Zone plate focusing optics).
The SPEM at the Elettra synchrotron light source can operate in two modes: imaging and spectroscopy. In the first mode the sample surface is mapped by synchronized-scanning the sample with respect to the focused photon beam and collecting photoelectrons with a selected kinetic energy. The second mode is photoelectron spectroscopy from a microspot.
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Ultima modifica il Lunedì, 04 Febbraio 2013 14:19
