Conferences

Pagina 8 di 13

2014

1.


 		 Surface analysis at submicron scale: present and future of the Escamicroscopy SPEM at Elettra
L. Gregoratti et al.
workshop: "SPEM2014", 20 – 21 March, Diamond Light Source, Oxfordshire, UK
 
2.


 		 Pressure limits in the in-situ scanning photoemission imaging and spectromicroscopy characterization of SOFC componenents
M. Amati et al.
workshop: "SPEM2014", 20 – 21 March, Diamond Light Source, Oxfordshire, UK
 
3.


 		 Recent achievement in the micro- and nano-materials characterization by scanning photoemission imaging and spectromicroscopy
M. Amati et al.
E-MRS 2014 SPRING MEETING,  26 – 20 May, Lille, France
 
4.



 		 Scanning photoemission imaging and spectromicroscopy with synchrotron radiation, a powerful tool for micro- and nano-material characterization
M. Amati et al.
workshop: "SOLMAT2014",  17 – 18 June, Vipava, Slovenia
 
5.



 		 TOWARDS AMBIENT PRESSURE IN THE MICRO ‐  AND NANO ‐ MATERIALS CHARACTERIZATION BY SCANNING PHOTOEMISSION IMAGING AND SPECTROMICROSCOPY
M. Amati et al.
13th European Vacuum Conference, 8-12 September, 2014 Aveiro, Portugal
 
6.


 		 The Escamicroscopy Beamline: Unique High Pressure Solutions
H. Sezen et al.
ECOSS30, 31 August - 5 September, 2014 Antalya, Turkey
 
7.


 		 Characterization of catalytic materials with synchrotron based Spectromicroscopies
L. Gregoratti et al.
EMCat 2014, 3 September – 9 September, 2014 Seeon, Germany
 































 

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