X-Ray Fluorescence

The "Exciting X-Ray" World!

X-Ray Fluorescence is a highly versatile beamline developed by Elettra Sincrotrone Trieste. The beamline is optically designed to present beam parameters needed for high level measurements in spectroscopy as well as in microscopy.

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The beamline presently hosts an ultra-high vacuum chamber, operated in partnership with the IAEA. Thanks to the combination of the tuneable monochromatic beam of the Elettra X-Ray Fluorescence beamline and of the flexible 7-axis manipulator of the UHVC end-station, synergistic application of various X-Ray Spectrometry and Spectroscopic Techniques are enable.  Elemental analysis with XRF techniques for inhomogeneous samples (sub-mm XRF), for trace analysis (Total Reflection XRF -TXRF) or for depth resolution in the nanometer range (via Grazing Incidence or Grazing Exit X-Ray Fluorescence (GI/GE-XRF)), chemical speciation of specific elements (X-ray Absorption Near Edge Structure -XANES) or determination of layer thicknesses and optical constants via X-Ray Reflectometry (XRR) become feasible within the same instrument.

Proposal Submission

Collaborators and users are invited to contact the beamtime scientists well in advance the proposal submission deadline to discuss their proposals. This is of great importance to ensure the over whole feasibility of their experiments and a clear assessment of the technical requirements. In some cases, some test experiments can be organized. For more information, please visit the XRF beamline users' corner or the User Area.
Experimental chambers can be temporarily accommodated at the beamline to make use of the monochromatic beam (3.7-14 keV). For more information, please contact the beamline scientists.
Note that proposals can be submitted either via the Elettra Virtual User Office, of via the Way for Light portal.

IAEA Contingent:

IAEA Member State or participants of IAEA CRP are welcome to submit their proposals under the IAEA beamtime contingent. The next proposal deadline is in September 2016.