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The surface structure of Rh oxide

The surface and interface structure of the RhO2 ultra-thin film grown on Rh(100) has been investigated by means of x-ray photoelectron diffraction. Analysis of 2D angular distribution intensities of the O1s and Rh3d5/2 chemically shifted core levels allowed us to reveal a rippled buckling of the metal surface.



R. R. Zhan et al., J. Chem. Phys. 133, 214701 (2010).

HL_JChemPhys_2010.jpg

The surface and interface structure of the RhO2 ultrathin film grown on Rh(100) is investigated by means of x-ray photoelectron diffraction. Experimental and simulated one- and two-dimensional angular distribution intensities of the O1s and Rh3d5/2 chemically shifted core levels are quantitatively analyzed. The previously proposed O–Rh–O trilayer model is independently confirmed. A rippled buckling of the metal surface is observed at the oxide–metal interface, with a mean interfacial Rh–O distance which is 0.2 Å larger with respect to previous findings. The link between the local atomic rearrangement and the overall geometric and electronic properties of the oxide is discussed on

the basis of a thorough comparison with the corresponding RhO2 rutile structure.

Retrieve article
The Rh oxide ultrathin film on Rh(100): an x-ray photoelectron diffraction study;
Rong Rong Zhan, Erik Vesselli, Alessandro Baraldi, Silvano Lizzit, and Giovanni Comelli;
J. Chem. Phys. 133, 214701 (2010).
10.1063/1.3509777
Last Updated on Tuesday, 30 October 2012 12:05